Optical metrology · Software development · Image processing

Optical metrology · Software development · Image processing

  • Welcome

    • Company

  • News

  • Exhibitions

  • Products

    • Optics Test Equipment

    • measuring systems for drawing dies and punches

    • drawing die and wire measurement

    • Contact angle measuring systems

    • Micro scriber, Wafer contact angle, wafer stress measurement

    • Straightness, Flatness, positioning uncertainty by autocollimator

    • Measuring microscopes, Image processing

    • Flatness, Bow, Warp, curvature, glass thickness

    • Measuring systems for image intensifier tubes (IIT)

  • Product videos

  • Software Download

    • COMEF

    • ELCOLEVEL

    • ELCOWIN

    • RTM

    • SURFTENS

    • Teamviewer

  • Contact

    • ISO 9001 Certificate

    • Representatives

    • privacy policy

High accurate flatness & thickness measuring system for large substrates

 

Get in touch >

Download PDF

Flatscan 650 3D